Materials (Bulk): Damage, Tracks - Part IV

04 July 2018
T02. Materials (Bulk): Damage, Tracks T02.4 09:00 > 09:40 Materials (Bulk): Damage, Tracks - Part IV Campus 1 // AMPHI 2000 T02. Materials (Bulk): Damage, Tracks

09:00 T02.4-O1-187 Morphology of etched ion tracks in SiO2: dependence on ion energy and etching parameters > A. Andrea HADLEY 09:20 T02.4-O2-91 Helium in swift heavy ion irradiated ODS alloys > V. Vladimir Skuratov

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